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  4. Principal investigation for the application of structured light scanning for the measurement of thickness using differential measurement method
 
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2018
Conference Paper
Title

Principal investigation for the application of structured light scanning for the measurement of thickness using differential measurement method

Abstract
As an industrial approach, structured light scanning is an established technique to handle length measurement by using light as information carrier and a CCD sensor to acquire that data into the digital domain. By means of triangulation, contours can be scanned and initiating uniquely defined relative movements of the object add another dimension. So it is possible to scan surfaces as well. That technique is basically known by scientists and manufactures. However, the very high application diversity leads to problems that needs good engineering and interdisciplinary work. The aim of this paper is to explain how structured light scanning could deal with complex objects like elastic and quite flexible materials. To examine if that approach is principally possible and how uncertainties are scalable is the primary purpose. Furthermore, that fact and the measuring principle itself requires well-considered approaches in calibration, adjustment, data management until a needed construction to minimalize expansions and keep that system working stable within industrial environments.
Author(s)
Illmann, R.
Rosenberger, M.
Notni, G.
Mainwork
Joint IMEKO TC1-TC7-TC13 Symposium "Measurement science challenges in natural and social sciences" 2017  
Conference
Symposium "Measurement Science Challenges in Natural and Social Sciences" 2017  
Open Access
DOI
10.1088/1742-6596/1044/1/012058
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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