English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
Combination of FE simulation and micro deformation measurements - A promising approach to consider reliability aspects right from the start
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
2010
Conference Paper
Title
Combination of FE simulation and micro deformation measurements - A promising approach to consider reliability aspects right from the start
Author(s)
Sommer, J.-P.
Michel, Bernd
Brämer, Birgit
Kugler, A.
Rank, H.
Mainwork
Smart systems integration 2010. 4th European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components. CD-ROM
Conference
European Conference & Exhibition on Integration Issues of Miniaturized Systems - MEMS, MOEMS, ICs and Electronic Components 2010
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS
