Achieving IC reliability targets by incorporating WLR results

Multiple microscopic mechanisms lead to a wear-out of ICs in the field. During design, they can be virtually assessed. For instance, aging simulations can predict how transistor degradation due to BTI and HCI will affect circuit performance over time. These simulations require a significant computational effort so that they have not been used extensively in design projects yet. To push virtual reliability assessments in IC design projects, we work on providing designers a low-threshold access to reliability information. This talk presents two approaches, RelXplorer and ReliaVision, that are based on the results of WLR measurements to solve different aspects in the field of Design for Reliability.