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Application of nanometer-multilayer optics for x-ray analysis
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2002
Conference Paper
Title
Application of nanometer-multilayer optics for x-ray analysis
Author(s)
Dietsch, R.
Braun, S.
Holz, T.
Leson, A.
Mainwork
NANOFAIR 2002, European Nanotechnology Symposium
Conference
European Nanotechnology Symposium (NANOFAIR) 2002
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
