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  4. Integrated wavelength demultiplexer-receiver on InP
 
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1992
Journal Article
Title

Integrated wavelength demultiplexer-receiver on InP

Abstract
A detector stage comprising a photodiode, a field-effect transistor, and a load resistor, and a wavelength demultiplexer have been monolithically integrated in the GaInAsP/InP material system. Chips were mounted into complete modules and operated in a 1.3 mu m/1.55 mu m bidirectional transmission link. At 576 Mbit/s and 10-9 bit error rate the sensitivity of the module was -21 dBm, while the intrinsic sensitivity of the receiver was determined to be -21 dBm.
Author(s)
Bornholdt, C.
Trommer, D.
Unterborsch, G.
Bach, H.G.
Kappe, F.
Passenberg, W.
Rehbein, W.
Reier, F.
Schramm, C.
Stenzel, R.
Umbach, A.
Venghaus, H.
Weinert, C.M.
Journal
Applied Physics Letters  
DOI
10.1063/1.107460
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • field effect integrated circuits

  • gallium arsenide

  • iii-v semiconductors

  • indium compounds

  • infrared detectors

  • integrated optoelectronics

  • multiplexing equipment

  • optical communication equipment

  • photodiodes

  • receivers

  • integrated wavelength demultiplexer receiver

  • monolithic integration

  • iii-v semiconductor

  • detector stage

  • photodiode

  • field-effect transistor

  • load resistor

  • bidirectional transmission link

  • bit error rate

  • sensitivity

  • intrinsic sensitivity

  • 1.3 micron

  • 1.55 micron

  • 576 mbit/s

  • inp

  • GaInAsP-InP

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