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1992
Journal Article
Title
Integrated wavelength demultiplexer-receiver on InP
Abstract
A detector stage comprising a photodiode, a field-effect transistor, and a load resistor, and a wavelength demultiplexer have been monolithically integrated in the GaInAsP/InP material system. Chips were mounted into complete modules and operated in a 1.3 mu m/1.55 mu m bidirectional transmission link. At 576 Mbit/s and 10-9 bit error rate the sensitivity of the module was -21 dBm, while the intrinsic sensitivity of the receiver was determined to be -21 dBm.
Keyword(s)
field effect integrated circuits
gallium arsenide
iii-v semiconductors
indium compounds
infrared detectors
integrated optoelectronics
multiplexing equipment
optical communication equipment
photodiodes
receivers
integrated wavelength demultiplexer receiver
monolithic integration
iii-v semiconductor
detector stage
photodiode
field-effect transistor
load resistor
bidirectional transmission link
bit error rate
sensitivity
intrinsic sensitivity
1.3 micron
1.55 micron
576 mbit/s
inp
GaInAsP-InP