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  4. Degradation modeling and validation - bottlenecks for standard use of aging simulations in IC design
 
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2020
Presentation
Title

Degradation modeling and validation - bottlenecks for standard use of aging simulations in IC design

Title Supplement
Paper presented at IEEE Automotive Reliability and Test Workshop, ART 2020, 5-6 November 2020, Virtual Conference
Abstract
Qualification according to the industry-standard AEC-Q100 is state of the art to verify the reliability of integrated circuits that are applied in automotive electronics. However, there are indications that this will not be sufficient for future applications. Instead, simulation-based reliability assessments in IC and system development are intended to complement qualification and allow efficient investigations of product reliability. Aging simulations for analog circuits have been available for years but appear to be hardly used. This article outlines degradation models and validation as bottlenecks that have to be overcome to establish aging simulations as a standard verification step in the future.
Author(s)
Lange, André  orcid-logo
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Jancke, Roland  
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Project(s)
ARAMID
ELDA-MP
Funder
European Commission EC  
Bundesministerium für Wirtschaft und Energie BMWi (Deutschland)  
Conference
Automotive Reliability and Test Workshop (ART) 2020  
File(s)
Download (962.8 KB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-409378
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Keyword(s)
  • aging simulation

  • degradation model

  • transistor reliability

  • qualification

  • validation

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