English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Have you forgotten your password?
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
Single grain scratch tests on GaAs for the determination of relevant engaging parameters for a ductile material removal
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
1999
Conference Paper
Title
Single grain scratch tests on GaAs for the determination of relevant engaging parameters for a ductile material removal
Author(s)
Uhlmann, E.
Engel, H.
Hammer, R.
Paesler, C.
Mainwork
Precision Engineering - Nanotechnology. Proceedings of the 1st International EUSPEN Conference. Vol.1
Conference
European Society for Precision Engineering and Nanotechnology (International Conference and General Meeting) 1999
Language
English
Fraunhofer-Institut für Produktionsanlagen und Konstruktionstechnik IPK
