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2015
Conference Paper
Title
A fast rotating scanning approach for millimeter wave imaging
Abstract
Millimeter wave imaging technologies offer a wide spectrum of new applications. Research results of the last year's show, that millimeter waves can be used to detect letter bombs and non-metallic impurities inside products or can be used to control material parameters in real-Time applications to detect fluctuations during the production. The main challenge for an operational system is the development of fast and cheap scanner concepts for this frequency range.
Conference