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  4. A low-noise saturation-stacked bandgap reference for image sensor applications
 
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2014
Conference Paper
Title

A low-noise saturation-stacked bandgap reference for image sensor applications

Abstract
A novel architecture for a bandgap voltage reference is presented in this paper. The voltage reference, designed for image sensor applications, is primarily targeted for a low-noise operation along with other practical constraints such as high power supply rejection, temperature immunity and short start-up time. The analysis and operation of the circuit is discussed and the trade-offs involved in the implementation aspects are examined. The measurement results of the fabricated circuit in a 0.35-µm CMOS process show a noise voltage level of 450 nV/sqrt(Hz) at 10 Hz, a temperature coefficient of 14 ppm/K and a PSRR of 52 dB.
Author(s)
Subbiah, Iyappan
RWTH Aachen
Süss, Andreas
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Kravchenko, Andrey
Uni DuE
Hosticka, Bedrich J.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Krautschneider, Wolfgang H.
Uni Hamburg
Mainwork
International Semiconductor Conference, CAS 2014. Proceedings  
Conference
International Semiconductor Conference (CAS) 2014  
DOI
10.1109/SMICND.2014.6966450
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • saturation-stacked

  • low-noise

  • image sensors

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