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  4. Infrared investigation of persistent electrons in undoped semi-insulating GaAs, photogenerated during EL2 bleaching at 10 K
 
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1988
Conference Paper
Title

Infrared investigation of persistent electrons in undoped semi-insulating GaAs, photogenerated during EL2 bleaching at 10 K

Title Supplement
Chapter 2
Other Title
Infrarot Untersuchung an persistenten Elektronen in undotiertem semi-isolierendem GaAs, photogeneriert während des EL2 Bleichens bei 10 K
Abstract
Using infrared spectroscopy the photoexcitation of free carriers with sub bandgap monochromatic light is investigated. The results are interpreted in terms of photoionization and carrier trapping at the EL2 center and two additional centers. The microscopic nature of the additional centers is not known. Similarities of the present spectral response with results obtained in other experiments are pointed out. (IAF)
Author(s)
Fuchs, F.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Dischler, B.
Mainwork
5th Conference on Semi-Insulating III-V Materials '88. Proceedings  
Conference
Conference on Semi-Insulating III-V Materials 1988  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • Bleichen

  • EL2

  • Elektron(persistent)

  • GaAs

  • Infrarot

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