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  4. Development of charged particle detectors by integrating gas amplification stages and CMOS ASICs on wafer level
 
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2010
Conference Paper
Title

Development of charged particle detectors by integrating gas amplification stages and CMOS ASICs on wafer level

Abstract
Gaseous detectors with a highly pixelized readout have demonstrated good capabilities of tracking high energetic particles. In particular, using post-processing methods to integrate the gas amplification stage on top of pixel readout chips has proven to detect single electrons with a very high efficiency and accuracy. So far, these detectors called InGrids or GEMGrids have been produced in a chip based process at the University of Twente. A new wafer based production process has been set up. A first test sample has been produced and tested. Signals from a as well as from a source could be observed.
Author(s)
Kaminski, J.
Baumgartner, T.
Desch, K.
Ehrmann, O.
Fritzsch, T.
Krautscheid, T.
Mayer, S.
Töpper, M.
Mainwork
3rd Electronics System Integration Technology Conference, ESTC 2010. Proceedings. Vol.2  
Conference
Electronics System Integration Technology Conference (ESTC) 2010  
DOI
10.1109/ESTC.2010.5642941
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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