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  4. Electroluminescence from silicon vacancy centers in diamond p-i-n diodes
 
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2016
Journal Article
Title

Electroluminescence from silicon vacancy centers in diamond p-i-n diodes

Abstract
The silicon vacancy center (SiV) in diamond is promising for future quantum applications due to its unique properties like narrowband emission in the near infrared regime at 738 nm and photostability at room temperature. In this paper we investigate the photoluminescence and electroluminescence properties of SiV centers incorporated into the intrinsic-layer of single crystalline diamond p-i-n junction diodes via in-situ doping during CVD-growth. The experiments reveal electrical excitation of the SiV emission by applying forward currents. The electroluminescence and photoluminescence properties are compared and discussed.
Author(s)
Tegetmeyer, B.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schreyvogel, C.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Lang, Nicola  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Müller-Sebert, W.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Brink, D.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Nebel, C.E.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Diamond and Related Materials  
Conference
International Conference on Diamond and Carbon Materials 2015  
DOI
10.1016/j.diamond.2016.01.022
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • SiV center

  • p-i-n Diode

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