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  4. Laboratory LPP EUV reflectometer working with non-polarized radiation
 
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2005
Conference Paper
Title

Laboratory LPP EUV reflectometer working with non-polarized radiation

Abstract
A laboratory extreme ultraviolet reflectometer (EUVR) for the wavelength range from 10 to 16 nm was built at IWS Dresden using a gold target laser pulse plasma (Au-LPP) source. The peak reflectance and the center wavelength are reproduced in relative standard deviation of 0.2 and 0.02%, respectively. In contrast to measurements using linearly polarized s-adjusted synchrotron radiation at PTB, measurements with non-polarized radiation at the EUVR yield systematically lower values for the reflectance due to the smaller reflectance of the p-component at higher angles of incidence.
Author(s)
Loyen, L. van
Böttger, T.
Schädlich, S.
Braun, S.
Foltyn, T.
Leson, A.
Scholze, F.
Müllender, S.
Mainwork
13th Applied Surface Analysis Workshop 2004  
Conference
Applied Surface Analysis Workshop 2004  
DOI
10.1016/j.apsusc.2005.01.113
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
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