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Frequency dependent admittance analysis on amorphous silicon photodetectors for integrated optical waveguides
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1995
Journal Article
Title
Frequency dependent admittance analysis on amorphous silicon photodetectors for integrated optical waveguides
Author(s)
Steiner, K.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Kühner, G.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Eberhard, D.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Wagner, E.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Journal
Sensors and Actuators. A
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM
