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Evaluation of Diffraction Patterns in High Energy X-Ray Analysis
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2007
Conference Paper
Title
Evaluation of Diffraction Patterns in High Energy X-Ray Analysis
Author(s)
Luczak, F.
Kämpfe, B.
Urban, M.
Mainwork
MicroNanoReliability 2007, 1st World Congress MicroNanoReliability
Conference
International Congress on Microreliability and Nanoreliability in Key Technology Applications (MNR) 2007
World Congress MicroNanoReliability 2007
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
