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  4. Deformation measurements of high-speed MEMS with combined two-wavelength single-pulse digital holography and single phase reconstruction using subpicosecond pulses
 
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2009
Journal Article
Title

Deformation measurements of high-speed MEMS with combined two-wavelength single-pulse digital holography and single phase reconstruction using subpicosecond pulses

Abstract
Holographic contouring of high-speed microelectromechanical system optical scanner mirrors operating at resonance frequencies close to 1 kHz is performed with ultrashort-pulse lasers containing two spectral components. These particular pulses are obtained by shaping the spectrum of sub-30 fs pulses of a Ti:sapphire laser system by an acousto-optic programmable dispersive filter. The separation of the two spectral components is adjustable within the 50-nm gain bandwidth. Single-pulse dual-wavelength contouring is achieved by an extended Twyman-Green type interferometer including two CMOS cameras. The deformation obtained from a single-wavelength interferogram is combined with the coarse-shape information deduced from the phase difference map of the two interferograms captured at different wavelengths to yield a combined reconstruction.
Author(s)
Hansel, T.
Grunwald, R.
Reimann, K.
Bonitz, Jens  
Kaufmann, C.
Griebner, U.
Journal
IEEE Journal of Selected Topics in Quantum Electronics  
DOI
10.1109/JSTQE.2009.2017032
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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