English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Have you forgotten your password?
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Artikel
New concept for applying edge line phase-shifting masks to arbitrary mask layouts
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
1996
Journal Article
Title
New concept for applying edge line phase-shifting masks to arbitrary mask layouts
Author(s)
Weiß, M.
Henke, W.
Journal
Microelectronic engineering
DOI
10.1016/0167-9317(95)00215-4
Language
English
Fraunhofer-Institut für Siliziumtechnologie ISIT