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Nanoscale charge transport measurements using a double-tip scanning tunneling microscope
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2008
Journal Article
Title
Nanoscale charge transport measurements using a double-tip scanning tunneling microscope
Author(s)
Jaschinsky, P.
Fraunhofer-Center Nanoelektronische Technologien CNT
Wensorra, J.
Forschungszentrum Jülich
Lepsa, M.I.
Forschungszentrum Jülich
Myslivecek, J.
Charles University, Prag
Voigtländer, B.
Forschungszentrum Jülich
Journal
Journal of applied physics
Open Access
DOI
10.1063/1.3006891
Language
English
CNT