Influence of the measurement object's reflective properties on the accuracy of array projection-based 3D sensors

In order to increase the measurement speed of pattern projection-based three-dimensional (3-D) sensors, in 2014, we introduced the so-called array projector which allows pattern projection at several 1,000 fps. As the patterns are switched by switching on and off the light sources of multiple slide projectors, each pattern originates from a different projection center. This may lead to a 3-D point deviation when measuring glossy objects. In this contribution, we theoretically and experimentally investigate the dependence of this deviation on the measurement object's reflective properties. Furthermore, we propose a procedure for compensating for this deviation.