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  4. Integrated design and test generation under internet based environment MOSCITO
 
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2002
Conference Paper
Title

Integrated design and test generation under internet based environment MOSCITO

Abstract
This paper describes an environment for internetbased collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented. The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.
Author(s)
Schneider, A.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Diener, K.-H.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Ivask, E.
Ubar, R.
Mainwork
Euromicro Symposium on Digital System Design: Architectures, Methods and Tools. Proceedings  
Conference
EUROMICRO Symposium on Digital System Design (DSD) 2002  
DOI
10.1109/DSD.2002.1115368
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Keyword(s)
  • integrated design

  • system on chip

  • Internet based environment MOSCITO

  • automatic test pattern generation

  • fault simulation tools

  • hierarchical level

  • virtual environment

  • integrated tool

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