2004
Conference Paper
Title

A Traceable Method for the Arc-free Characterization and Modeling of CDM testers and Pulse Metrology Chains

Abstract
A traceable low-voltage network analysis in the time and frequency domain is introduced for the arcfree characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.
Author(s)
Gieser, H.A.
Wolf, H.
Soldner, W.
Reichl, H.
Andreini, Antonio
Natarajan, Mahadeva Iyer
Stadler, Wolfgang
Mainwork
Conference
Language
English