2010
Poster
Title

Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application

Title Supplement
Poster at 14th European FIB Users Group Meeting (EFUG 2010), Gaeta, Italy
Author(s)
Jambreck, J.D.
Yanev, V.
Schmitt, H.
Rommel, Mathias  orcid-logo
Bauer, A.J.
Frey, L.
Conference
DOI
File(s)
Rights
Under Copyright
Language
English
Keyword(s)