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2000
Conference Paper
Title

Industrial application of heterostructure device simulation

Other Title
Industrielle Anwendung von Heterostruktur Bauelement Simulation
Abstract
We give an overview of the state-of-the-art of heterostructure RF-device simulation for industrial application based on III-V compound semiconductors. Results for Heterostructure Bipolar Transistors (HBTs) and for High Electron Mobility Transistors (HEMTs) are presented in good agreement with measured data of industrially relevant devices.
Author(s)
Palankovski, V.
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Selberherr, S.
Mainwork
22nd GaAs IC Symposium 2000. Technical digest  
Conference
GaAs IC Symposium 2000  
DOI
10.1109/GAAS.2000.906305
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • HBT

  • HEMT

  • heterostructure

  • Heterostruktur

  • III-V semiconductor

  • III-V Halbleiter

  • simulation tool

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