2007
Conference Paper
Title

A test system for ensuring material reliability in micro- and nanoelectronics

Title Supplement
Abstract
Author(s)
Wittler, O.
Auerswald, E.
Dermitzaki, E.
Gollhardt, A.
May, D.
Schmitz, S.
Wunderle, B.
Michel, B.
Mainwork
Conference
Language
English