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  4. Electrical and structural characteristics of thin buried oxide
 
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1993
Conference Paper
Title

Electrical and structural characteristics of thin buried oxide

Author(s)
Meda, L.
Bertoni, S.
Cerofolini, G.F.
Gassel, H.
Mainwork
E-MRS Spring Meeting 1993. Final book of abstracts  
Conference
European Materials Research Society (Spring Meeting) 1993  
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • current-voltage characteristic

  • silicon-on-insulator

  • SIMOX

  • Strom-Spannungs-Kennlinie

  • transmission electron microscopy

  • Transmissionselektronenmikroskop

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