Characterization of Computer Tomography Scanners Using the Probability of Detection Method

Industrial computed tomography (CT) is increasingly gaining in importance as a nondestructive testing method (NDT). As with any other NDT method, the requirement for its performance and detection capabilities to be assessed increases as it is used more frequently. Simultaneously, it is becoming important for users to be able to quantitatively measure and compare the suitability of systems available on the market for their own applications. This probability of detection (POD) method makes it possible to create application-specific POD curves for CT systems using a specially-developed POD test specimen. Within the context of this study, a micro-CT scanner with an accelerating voltage of 225 kV and specimens of stainless steel with thicknesses of 1,050 and 2,050 mm was assessed as an example. When developing this method, special value was placed on reproducibility and universal applicability.