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  4. Detection of different target-DNA concentrations with highly sensitive AlGaN/GaN high electron mobility transistors
 
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2015
Journal Article
Title

Detection of different target-DNA concentrations with highly sensitive AlGaN/GaN high electron mobility transistors

Abstract
This paper presents the successful detection of different target-DNA concentrations using AlGaN/GaN high electron mobility field effect transistors (HEMTs). The gate was bio-functionalized with two different densities of complementary DNA before application of target-DNA. Dosages of 10-16 mol/L up to the gate saturation were tested. The DNA concentration was increased by a factor of 10 each time, and the transistor transfer characteristics were measured. The threshold voltage shift and drain-source current change depend on target concentration and obey the Sips adsorption model. The AlGaN/GaN HEMTs are highly sensitive to very low target-DNA concentrations with a detection limit of 10-14 mol/L. The gates with a low probe-DNA density were saturated with a lower target-DNA concentration and presented a faster hybridization equilibrium constant.
Author(s)
Espinosa, N.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schwarz, S.U.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Cimalla, Volker  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Sensors and Actuators. B  
DOI
10.1016/j.snb.2015.01.019
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • highly sensitive AlGaN/GaN HEMT

  • low target-DNA concentration

  • transfer characteristics

  • threshold voltage

  • sips isotherm

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