2013
Master Thesis
Title

Röntgenstrukturanalyse von GaN/Al(x)Ga(1-x)N-Heterostrukturen auf Silizium

Other Title
Structural characterization of GaN/Al(x)Ga(1-x)N-heterostructures of silicon with high-resolution X-ray diffraction
Thesis Note
Freiburg/Brsg., Univ., Master Thesis, 2013
Author(s)
Ekeris, W. van
Publishing Place
Freiburg/Brsg.
Language
German