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0.15 mu-m passivated InP-based HEMT MMIC technology with high thermal-stability in hydrogen ambient
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2000
Journal Article
Titel
0.15 mu-m passivated InP-based HEMT MMIC technology with high thermal-stability in hydrogen ambient
Author(s)
Chertouk, M.
Dammann, Michael
Kohler, Klaus
Weimann, G.
Zeitschrift
IEEE Electron Device Letters
DOI
10.1109/55.823568
Language
English
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Fraunhofer-Institut für Angewandte Festkörperphysik IAF