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Characterization and optimization of a bipolar ESD-device by measurements and simulations
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1999
Journal Article
Title
Characterization and optimization of a bipolar ESD-device by measurements and simulations
Author(s)
Stricker, A.D.
Mettler, S.
Wolf, H.
Mergens, M.
Wilkening, W.
Gieser, H.
Fichtner, W.
Journal
Microelectronics reliability
DOI
10.1016/S0026-2714(99)00075-X
Language
English
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