Imaging scatterer planes by photoelectron diffraction

A novel direct crystallographic method CHRISDA (combined holographic real-space imaging by superimposed dimer function algorithm) is proposed which permits an assessment of the near-surface structure of a solid sample by analysis of a single core-level photoemission or Auger emission diffraction pattern (XPD or AED) recorded over the hemisphere of electron escape angles. Combining the elements of holography and real-space triangulation, the approach achieves a high spatial resolution (about 0.1 A.U.) and requires a knowledge of only a few non-structural parameters. To demonstrate the experimental efficacy of CHRISDA, a Sn film deposited on a CdTe(lll) substrate is analyzed and yields the diamond structure characteristic of alpha-Sn.