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  4. Effect of anomalous transmittance in EUV multilayer optics
 
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2008
Journal Article
Title

Effect of anomalous transmittance in EUV multilayer optics

Abstract
In this paper the effect of anomalous transmittance in the EUV spectral region is considered theoretically. The effect consists in a resonant enhancement of the transmittance of a periodic multilayer structure compared with that of a uniform film. The physical reason of the effect lies in the fact that the minima of the wave field intensity of a certain wavelength are placed just in the center of thin absorbing layers resulting in a resonant decrease of wave absorption. The condition of this appearance is analyzed: it is necessary the absorption coefficient (imaginary part of the dielectric constant) of two materials composing a multilayer structure to differ by a factor of 10, at least. A possibility of the use of a multilayer filter in metrology of broadband EUV sources is discussed.
Author(s)
Kozhevnikov, I.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Yulin, S.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Feigl, T.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Kaiser, N.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Journal
Optics communications  
DOI
10.1016/j.optcom.2008.01.057
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • x-ray

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