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  4. Fan Out Wafer Level Packaging - Towards a European Manufacturing Supply Chain
 
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2025
Conference Paper
Title

Fan Out Wafer Level Packaging - Towards a European Manufacturing Supply Chain

Abstract
Fan Out Wafer Level Packaging Towards a European Manufacturing SupplyChain Fan-Out Wafer Level Packaging (FOWLP) has emerged as a critical technology for advanced, low-cost miniaturized packages in the last decade. Now it is a preferred solution for advanced electronic applications, which require small footprints, thin packages and enhanced RF- and thermal performance, featuring multi-die and multi-layer RDL configurations. Despite its proven potential, FOWLP remains largely inaccessible for smaller volumes in the European market, as well known OSATs target large volumes (>several mio. packages p.a.). Herein, we present FOWLP manufacturing based on the 'Mold First' variant. A single-die package with one redistribution layer is manufactured, using a RF-Die, operating in the lower two-digit GHz range. Challenges like warpage and thermomechanical shifts during the molding process ('Die Shift') are addressed. This shift needs to be compensated in order to enable adequate RF-performance, especially towards higher frequencies, which typically feature smaller RF-pads and stricter requirements of via positioning on die pads. After thin film Cu-redistribution layer (RDL) manufacturing and backgrinding, solder-ball attach and package singulation complete package manufacturing. Results regarding $R F$-performance, in terms of $S$ parameters, are promising and on par with results from a comparable package. This highlights that - for 'core Fan-Out' packages - realizing a European manufacturing chain is within reach in order to lower entry barriers into FOWLP for smaller and medium volumes.
Author(s)
Dreissigacker, Marc
AEMtec GmbH
Lieske, Daniel
AEMtec GmbH
Wöhrmann, Markus  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Braun, Tanja  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keller, Aleksandr
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Mainwork
25th European Microelectronics and Packaging Conference & Exhibition, EMPC 2025. Proceedings  
Conference
European Microelectronics and Packaging Conference & Exhibition 2025  
DOI
10.23919/EMPC63132.2025.11222469
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • Europe

  • Fan-Out Wafer Level Packaging

  • FOWLP

  • Mold First

  • RF

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