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  4. Dislocation conversion and propagation during homoepitaxial growth of 4H-SiC
 
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2010
Conference Paper
Title

Dislocation conversion and propagation during homoepitaxial growth of 4H-SiC

Author(s)
Kallinger, B.  orcid-logo
Thomas, B.
Polster, S.
Berwian, P.  orcid-logo
Friedrich, J.  
Mainwork
Silicon carbide and related materials 2009  
Conference
International Conference on Silicon Carbide and Related Materials 2009  
Open Access
DOI
10.4028/www.scientific.net/MSF.645-648.299
Additional link
Full text
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • epitaxial growth

  • dislocation

  • x-ray topography

  • KOH etching

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