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  4. Scaling of GaN FinFETs on 4 Inch Silicon Carbide from 20 to 150 Fins with Maximum Frequency of Oscillation fmax = 20.4 GHz
 
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2024
Conference Paper
Title

Scaling of GaN FinFETs on 4 Inch Silicon Carbide from 20 to 150 Fins with Maximum Frequency of Oscillation fmax = 20.4 GHz

Abstract
The fin field-effect transistor (FinFET) is a promising candidate among vertical GaN-based transistors as it is inherently unipolar and requires neither p-type doping nor regrowth processes. While commonly regarded as a high power device, recent research has started to explore its potential as a high frequency transistor. In our previous work, we demonstrated a small-signal current gain of f t = 10.2GHz for a FinFET with 20 fins. More recently, we presented our investigations on the scaling of the fin length and its influence on the small-signal performance based on FinFETs processed on 3 inch sapphire substrate. In this work, we expand our studies to investigate the scaling effect of the number of fins in FinFETs, and report new record values for the maximum frequency of oscillation f max for vertical GaN transistors.
Author(s)
Sinnwell, Matthias  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Dammann, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Driad, Rachid  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Leone, Stefano  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mikulla, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
DRC 2024, 82nd Device Research Conference. Conference Digest  
Conference
Device Research Conference 2024  
DOI
10.1109/DRC61706.2024.10605504
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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