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  4. Particle detection in the barrier layer production
 
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2010
Presentation
Title

Particle detection in the barrier layer production

Title Supplement
Presentation held at Functional Polymeric Surfaces, Session on 28th of October during the fair "K 2010" in Düsseldorf
Abstract
Even under ideal process conditions particles can cause weak barrier functionality through defects in the layers. - Particles are generated during manufacturing and processing of substrate materials. - Particle-free confectioning of substrate material would be ideal but is not available in the market presently. However, the knowledge for suitable equipment design is available. - For reliable process control and quality assurance an effective detection of particles is necessary. This should also be possible in-line. - A new particle scanner with high sensitivity and very short measurement time has been developed.
Author(s)
Bürger, Frank  
Conference
K-Messe 2010  
File(s)
Download (1.37 MB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-368099
Language
English
Fraunhofer-Institut für Produktionstechnik und Automatisierung IPA  
Keyword(s)
  • Partikelscanner

  • Kontaminationskontrolle

  • Folie

  • particle

  • cleanroom

  • contamination control

  • surface

  • Kontamination

  • Teilchen

  • Reinraum

  • Oberfläche

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