Corrosion tests in artificial atmosphere with SO2 and H2S

Connector materials like IC-pins, the IC-socket materials, the solder connections etc. were observed by the use of interference lightmicroscopy, scanning electron microscopy with x-ray-analysis and x-ray-spectrography to detect the structure of the corrosion layer after atmospheric corrosion tests with SO2 and H2S. Most of the invesitgations were done on grindings of the solded pins or soldering spots.