ToF-SIMS imaging of DBD-plasma-printed microspots on BOPP substrates
Imaging ToF-SIMS has been applied to characterize the surface chemistry variations across small areas produced by a DBD-type plasma printing technique on a BOPP substrate using pure nitrogen and a nitrogen-hydrogen gas mixture. CH4N+ and CNO- secondary ions are detected with high yields remote from the discharge region. They are discussed to be due to surface modifications of the substrate by metastable gas-phase species. On the other hand, surface species exist that are preferentially formed by reactions of the substrate with short-lived species which are only present close to the plasma discharge region. A C3H8O+ secondary fragment ion is assumed to be a key such a surface species.