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  4. Systematical study of InAIN/GaN devices by numerical simulation
 
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2008
Conference Paper
Titel

Systematical study of InAIN/GaN devices by numerical simulation

Alternative
Eine systematische Studie von InAlN/GaN Bauelementen durch numerische Simulation
Author(s)
Vitanov, S.
Palankovski, V.
Pozzovivo, G.
Kuzmik, J.
Quay, RĂ¼diger orcid-logo
Fraunhofer-Institut fĂ¼r Angewandte Festkörperphysik IAF
Hauptwerk
HETECH 2008, 17th European Workshop on Heterostructure Technology
Konferenz
European Workshop on Heterostructure Technology (HETECH) 2008
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Language
English
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Fraunhofer-Institut fĂ¼r Angewandte Festkörperphysik IAF
Tags
  • electronics

  • Elektronik

  • device simulation

  • Bauelement Simulation...

  • HEMT

  • GaN

  • InAlN

  • indium

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