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  4. Systematical study of InAIN/GaN devices by numerical simulation
 
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2008
Conference Paper
Title

Systematical study of InAIN/GaN devices by numerical simulation

Other Title
Eine systematische Studie von InAlN/GaN Bauelementen durch numerische Simulation
Author(s)
Vitanov, S.
Palankovski, V.
Pozzovivo, G.
Kuzmik, J.
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
HETECH 2008, 17th European Workshop on Heterostructure Technology  
Conference
European Workshop on Heterostructure Technology (HETECH) 2008  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • electronics

  • Elektronik

  • device simulation

  • Bauelement Simulation

  • HEMT

  • GaN

  • InAlN

  • indium

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