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Micro- and nanoscale deformation measurements at interface crack tips
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2008
Conference Paper
Titel
Micro- and nanoscale deformation measurements at interface crack tips
Author(s)
Keller, J.
Mayer, S.
Gollhardt, A.
Michel, B.
Hauptwerk
2nd IEEE International Interdisciplinary Conference on Portable Information Devices, Portable2008) and the 2008 7th IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics, PORTABLE-POLYTRONIC 2008. Proceedings
Konferenz
International Interdisciplinary Conference on Portable Information Devices (Portable) 2008
International Conference on Polymers and Adhesives in Microelectronics and Photonics (Polytronic) 2008
DOI
10.1109/PORTABLE-POLYTRONIC.2008.4681288
Language
English
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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
