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  4. Assessment of thermal and process properties of lead-free solder pastes for high reliable electronic devices
 
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2009
Conference Paper
Titel

Assessment of thermal and process properties of lead-free solder pastes for high reliable electronic devices

Abstract
Increasing void contents has been discovered in the course of conversion to lead-free materials in the manufacturing of electronic components and packages. At the present time these voids are probably originated by the common flux materials which are issued by the most manufacturers. Regrettably, the common applied fluxes are transferred from basic flux materials for lead-containing solders. For a better understanding different soldering parameters of five selected lead-free solder pastes were tested and analysed to identify affecting the generation of voids. X-ray investigations of the dynamic reflow kinetics proved to be a valuable tool to investigable the void creation in solder joints.
Author(s)
Bertels, L.
Poech, M.
Hutter, M.
Thomas, T.
Hauptwerk
IMAPS Nordic Annual Conference 2009
Konferenz
International Microelectronics and Packaging Society (IMAPS Nordic Annual Conference) 2009
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Fraunhofer-Institut für Siliziumtechnologie ISIT
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
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