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  4. Defect rate profile in large software-systems
 
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2006
Conference Paper
Title

Defect rate profile in large software-systems

Abstract
Software reliability, an issue raised long time ago by software engineering researchers, is still a problem that must be faced nowadays. Our approach is to handle reliability of software products making use of a statistical distribution based model and historical data of similar projects. We analyze the software error metrics of large software projects developed in a multinational company in the last five years, searching for a Rayleigh pattern in the defect rate profile. If we can prove empirically such a pattern exists in certain environment, we have a rapid and powerful theoretical model to support project estimation decisions early in the development life cycle when historical data on similar projects is available.
Author(s)
Modroiu, E.-R.
Schieferdecker, I.
Mainwork
Knowledge-based software engineering. Proceedings of the Seventh Joint Conference on Knowledge-Based Software Engingeering 2006  
Conference
Joint Conference on Knowledge-Based Software Engineering (JCKBSE) 2006  
Language
English
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS  
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