2000
Conference Paper
Title

Reliability and degradation of metal-oxide-semiconductor capacitors on 4H- and 6H-silicon carbide

Author(s)
Treu, M.
Schorner, R.
Friedrichs, P.
Rupp, R.
Wiedenhofer, A.
Stephani, D.
Ryssel, H.
Mainwork
Conference
Language
English