Image based surface microgeometry modelling for complex surfaces

Image based modelling of surfaces is a non-invasive method which allows for further surface analysis through reconstruction of the surface properties. It also allows for detection of deviant surface behaviour from what was to be expected. Microgeometry is modelled based on BRDF (Bidirectional Reflectance Distribution Function) and LBP (Local Binary Pattern) readings from a sequence containing multiple known image acquisition conditions (illumination and point of view). In order to quantitatively evaluate the quality of the defect detection simulation, we use an â-vs-a-analysis to determine the Probability of Detection (POD) of defects on a simulated surface inspection. The POD designates the probability to detect a defect which is present in the component, and will here be determined as a function of defect size a. We discuss the POD and its usability as a tool for determining the quality of the image processing simulation.