Terahertz Quantum Metrology

Modern terahertz detectors enable direct measurement of the electric field, providing simultaneous access to amplitude and phase information of the terahertz radiation. However, conventional systems are often based on single-pixel detectors, limiting most imaging applications to slow raster-scanning techniques.
This work presents the demonstration of a novel approach for amplitude- and phase-sensitive imaging in the terahertz range using quantum imaging with undetected photons. By decoupling the sample measurement in the terahertz range from the detection of the information in the visible, this technique enables the use of cost-effective, highly developed multi-pixel optical components.
Central achievements are the observation of quantum interference with terahertz photons and its application to material characterization and molecular concentration analysis. Furthermore, image information was transferred from the terahertz to the visible spectral range, achieving a spatial resolution close to the terahertz wavelength. This approach thus provides direct access to amplitude, phase, and spectral information for imaging applications in the terahertz range using a multi-pixel camera.