• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Influence of substrate holder configurations on bias enhanced nucleation area for diamond heteroepitaxy: Toward wafer-scale single-crystalline diamond synthesis
 
  • Details
  • Full
Options
2019
Journal Article
Title

Influence of substrate holder configurations on bias enhanced nucleation area for diamond heteroepitaxy: Toward wafer-scale single-crystalline diamond synthesis

Abstract
A simple and effective method to extend the area of bias enhanced nucleation (BEN) for heteroepitaxial diamond growth is introduced. Two-inch substrates are placed on a flat and smooth surface of approximately 3-in. Mo substrate holder and then treated via BEN with or without metal-covered Siplates located right outside of the substrates. It is clarified that not only the plates themselves but also their thickness has a great impact on the BEN area, or in other words, the homogeneity of nucleation density on the substrates. As a result, the epitaxial diamond nucleation is successfully performed on nearly the whole area of a 2-in. Ir/YSZ/Si(001) substrate using the 1 mm thick halfring plates. For a proof of this concept, finite element method simulations are also performed to investigate the influence of such plates on plasma (electron) density distributions above the substrates. Throughout this study, the significance of substrate holder configurations for the widely accessible wafer-scale diamond heteroepitaxy is revealed.
Author(s)
Yoshikawa, Taro
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Herrling, David  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Meyer, Frank  
Fraunhofer-Institut für Werkstoffmechanik IWM  
Burmeister, Frank  
Fraunhofer-Institut für Werkstoffmechanik IWM  
Nebel, Christoph E.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Lebedev, Vadim  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Journal of vacuum science and technology B. Microelectronics and nanometer structures  
DOI
10.1116/1.5086020
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Fraunhofer-Institut für Werkstoffmechanik IWM  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024