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  4. Optically excited and interrogated micromechanical silicon cantilever structure
 
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1987
Conference Paper
Title

Optically excited and interrogated micromechanical silicon cantilever structure

Other Title
Optisch angeregte und abgetastete mikromechanische Silizium-Balkenstruktur
Abstract
Micromechanical silicon cantilever structures of typical dimensions 1 mm x 80 micrometers x 5 micrometers have been excited by absorption of pulsed light from diode laser at 790 nm or a LED at 830 nm respectively. The excitation motion of the cantilevers was measured by means of a fiber-optic Michelson interferometer as well as a reflective multimode fiber optic pick up. In addition to the optical signal the electrical signal of a thin film piezoresistive transducer localized at the base of the cantilever has been measured. The optimal fiber position with respect to the cantilever was determined experimentally. At this position a signal to noise ratio of about 6 could be realized for the detected signal at 5 kHz bandwidth for optical power levels of 56 micrometers. Using a 125 micrometers diameter optical fiber this corresponds to an optical power density of 4.6 mW/square millimeters which is below the critical value of 5 mW/square millimeters suggested for explosive environments.
Author(s)
Woelfelschneider, H.
Knoll, G.
Ramakrishnan, S.
Hoefflin, H.
Kist, R.
Mainwork
In-process optical metrology for precision machining  
Conference
International Symposium on Optical and Optoelectronic Applied Science and Engineering 1987  
DOI
10.1117/12.941086
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Frequenzcodierung

  • Mikromechanik

  • Sensor(faseroptisch)

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