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2026
Journal Article
Title

Deep Learning Pipeline for Defect Detection

Abstract
Deep Learning is successfully applied for detecting visual quality defects but comes with several challenges, e.g., annotating the data. Various tools, technologies, and frameworks have been introduced to simplify the implementation of DL. However, manufacturing companies often lack a general understanding of structuring a DL project and making relevant design decisions. In this paper, we demonstrate a methodological approach to integrate DL for defect detection in production. As a result, challenges and decisions are outlined in a pipeline that guides users through the DL project development process. The pipeline is validated based on surface defect detection for the lithium-ion battery coating process.
Author(s)
Mattern, Alexander  
Fraunhofer-Institut für Produktionstechnologie IPT  
Motz, Maximilian  
Fraunhofer-Institut für Produktionstechnologie IPT  
Grunert, Dennis  
Fraunhofer-Institut für Produktionstechnologie IPT  
Schmitt, Robert  
Fraunhofer-Institut für Produktionstechnologie IPT  
Journal
Procedia CIRP  
Conference
Conference on Intelligent Computation in Manufacturing Engineering 2024  
Open Access
File(s)
Download (538.8 KB)
Rights
CC BY-NC-ND 4.0: Creative Commons Attribution-NonCommercial-NoDerivatives
DOI
10.1016/j.procir.2026.01.143
10.24406/publica-7696
Additional link
Full text
Language
English
Fraunhofer-Institut für Produktionstechnologie IPT  
Keyword(s)
  • Anomaly Detection

  • Deep Learning

  • Deep Learning Pipeline

  • Defect Detection

  • Lithium-Ion-Battery

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