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  4. Lasing characteristics of InGaAs/InGaAsP MQW structures grown by low-pressure MOVPE
 
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1991
Journal Article
Title

Lasing characteristics of InGaAs/InGaAsP MQW structures grown by low-pressure MOVPE

Abstract
InGaAs/InGaAsP MQW SC lasers for 1.55 mu m emission wavelength with different numbers of quantum wells have been fabricated using low-pressure MOVPE. Photoluminescence and gain spectra and threshold current densities and the temperature behaviour T0 of broad area lasers at varying cavity lengths have been investigated.
Author(s)
Rosenzweig, M.
Ebert, W.
Franke, D.
Grote, N.
Sartorius, B.
Wolfram, P.
Journal
Journal of Crystal Growth  
Conference
International Conference on Metalorganic Vapor Phase Epitaxy 1990  
Workshop on MOMBE, CBE, GSMBE, and Related Techniques 1990  
DOI
10.1016/0022-0248(91)90561-I
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • gallium arsenide

  • gallium compounds

  • iii-v semiconductors

  • indium compounds

  • infrared spectra of inorganic solids

  • luminescence of inorganic solids

  • optical workshop techniques

  • photoluminescence

  • semiconductor growth

  • semiconductor junction lasers

  • vapour phase epitaxial growth

  • diode lasers

  • photoluminescence spectra

  • mqw structures

  • low-pressure movpe

  • quantum wells

  • gain spectra

  • threshold current densities

  • temperature behaviour

  • broad area lasers

  • cavity lengths

  • 1.55 micron

  • InGaAs-InGaAsp

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