Materials Characterization with the Acoustic Microscopy
Abstract
The material signature of the acoustic microscope in reflexion is calculated taking into account exactly abberation and phase shifts caused by different sound path lengths. The results allow to evaluate elastic material properties from the distance between an interference maximum and the maximum from specular reflexion of measured V(z) curves. This is necessary if rigid materials such as ceramics are investigated because in thesecases high frequency acoustic microscopes yield V(z) curves with one maximum only besides that from specular reflexion.
